Application of high voltage power supply in the field of X-ray instrument

      There are several types of analytical X-ray systems, such as X-ray fluorescence (XRF), X-ray diffraction (XRD), XAFS, XPS (ESCA), SAXS and EPMA. X-ray fluorescence spectrometer (XRF) includes energy dispersive X-ray analysis (EDX) and wavelength dispersive X-ray analysis (WDX), which are used to irradiate X-rays on the sample to determine the elements that make up the sample and their content. Different elements have different wavelengths of X-rays, so when the sample is irradiated with X-rays, X-rays with different wavelengths (energy) are returned.

In wavelength dispersive X-ray analysis, X-rays of different wavelengths change the diffraction angle, so when the X-rays hit the spectral crystal, they are wavelength resolved. The fluorescent X-rays reflected back from the sample are injected into the monochromator crystal for spectral analysis, just like visible light is split by a prism, and the intensity of the X-rays at each wavelength is measured by the detector. In energy dispersive X-ray analysis, a semiconductor detector receives fluorescent X-rays and processes the signal to measure the intensity of the X-rays at each wavelength. Both methods use an X-ray tube, which requires a filament power supply to generate hot electrons and an X-ray acceleration voltage supply.

       There are many ways to generate X-rays, including anode grounding and cathode grounding; cathode grounded X-rays are usually used for XRF, and anode grounded X-rays are used for XRD. Unlike non-destructive testing X-rays, analytical X-rays do not require much acceleration voltage. Therefore, the voltage can reach 60 kV, but the light intensity (brightness) may be required. In this case, a few kilowatts of X-ray tubes are used, and water cooling is used to prevent the tube from overheating. The detector built into the device may also require a power supply system of several hundred volts to several kilowatts.

Main applications:

X-ray fluorescence spectrometer (XRF), X-ray diffractometer (XRD), energy dispersive X-ray analysis (EDX), wavelength dispersive X-ray analysis (WDX), filament power supply, acceleration voltage